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| SEMINARS AND COURSES |
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Overview: We have been invited to provide a number of seminars and courses on display metrology. The most recent or most complete are included here. We have put together a Display Metrology Short Course with one day of lectures and two days (or three) of hands-on laboratory work. NIST also offers courses on photometry, colorimetry, and spectroradiometry that may be of great interest to you. If you want to simply download things using FTP (file transfer protocol) then go to Everything (FTP Site) [ftp://ftp.fpdl.nist.gov/pub/], which is available also from the home page. Publications: Flat-Panel-Display Measurement Techniques and Concerns: 2006 Seminar for the SID (see Sem06-FPDmeas_A6.pdf [9.7 MB] or the slide presentation Sem06-FPDmeas_A6.ppt [34 MB]). This is a 1.5 hour seminar presented during the 2006 SID. A number of changes have been made since the last posted seminar. Citation: E. F. Kelley, "Display Measurements for Flat Panel Displays," Application Tutorial A-6, Society for Information Display, 2006 International Symposium, San Francisco, California, June 9, 2006. Flat-Panel-Display Measurement Techniques and Concerns: 2004 Seminar for the SID (see Sem04-FPDmeas.pdf [6.9 MB] or the slide presentation Sem04-FPDmeas.ppt [15 MB]). This is a 1.5 hour seminar presented during the 2004 SID. It is very similar to the 2003 SID seminar below. Citation: E. F. Kelley, "Flat-Panel-Display Measurement Techniques and Concerns," 2004-SID International Symposium Seminar Lecture Notes, Society for Information Display, Seminar F-1, Vol. 2, pp. F-1/1-61, Seattle, WA, May 28, 2004. Fundamentals of Display Metrology: 2002 Short course for the SID (see the presentation SID02ShortCourseFunDM.ppt [22.3 MB] containing animated slides). This is a short course (4 hours) presented during the 2002 SID. It contains all the useful content of all previous SID seminars (1998-2002). Some material may be old. The most recent material is offered in our Display Metrology Short Course, but is not posted on this site (for obvious reasons... take the course [eight hours]!). Citation: E. F. Kelley, "Fundamentals of Display Metrology," 2002 Society for Information Display International Symposium Short Course S-3, 2002 SID International Symposium, Boston, Massachusetts, 205 pp., May 19-24, 2002. Courses: Display Metrology Short Course (NIST Optoelectronics Division) Photometry Short Course (NIST Optical Technology Division) Spectroradiometry Short Course (NIST Optical Technology Division) Notes: Updated 20061031T1902 For *.PDF files an Adobe Acrobat Reader will be required (Portable Document Format®, see http://www.adobe.com/products/acrobat/readstep.html ); *.PPT files will require Microsoft PowerPoint®; *.ZIP files will require unzipping (see http://www.pkware.com/ or http://www.winzip.com/ ) to obtain the bitmapped files in *.PNG format (Portable Network Graphics format, see http://www.libpng.org/pub/png/ ), other common formats may be used in addition; the ZIP files may also contain the native format files from the software used in their creation. |
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